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Atomic-scale imaging of sur...
Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A.
Materials Research Society 1993
Kongre- Conference papers and proceedings. Boston (Mass., 1992)

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Título:
Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A. / editors, David K. Biegelsen, David J. Smith, S.Y. Tong
Editorial:
Pittsburgh, Pa. : Materials Research Society, 1993
Descripción física:
1 online resource (ix, 288 pages) : illustrations
Tipo Audiovisual:
Atomic Congresses
Scanning Congresses
Surfaces Congresses
Mención de serie:
Materials Research Society symposium proceedings ; v. 295
Bibliografía:
Includes bibliographical references and index
Contenido:
Scanning Tunneling Microscopy for Hydrogen-Desorption-Induced Structural Change of Si(111) Surface / Y. Morita, K. Miki, H. Tokumoto, T. Sato, T. Sueyoshi and M. Iwatsuki. -- Steps on the (110) Surface of InP / Yong Liang, William E. Packard and John D. Dow. -- Scanning Tunneling Microscopy on Charge Density Waves in Layered Compounds / J.Th.M. De Hosson and G.P.E.M. Van Bakel. -- Design of Ultra High Vacuum Scanning Electron Microscope Combined With Scanning Tunneling Microscope / Mikio Takai, Naoki Yokoi, Ryou Mimura, Hiroshi Sawaragi and Ryuso Aihara. -- Scanning Tunneling Microscopy Perspective of Structures on Reduced SrTiO[subscript 3](001) Surfaces / Yong Liang and Dawn A. Bonnell. -- Surface Structure and Electronic Property of Reduced SrTiO[subscript 3](001) Surface Observed by STM/STS / Takuya Matsumoto, Hiroyuki Tanaka, Tomoji Kawai and Shichio Kawai. -- Metastable Structural Surface Excitations and Concerted Adatom Motions: A STM Study of Atomic Motions Within a Semiconductor Surface / Jene Golovchenko, Ing-Shouh Hwang, Eric Ganz and Silva K. Theiss. -- Mechanisms and Energetics of Surface Atomic Processes, an Atom-Probe Field Ion Microscope Study / Tien T. Tsong. -- Atomic Arrangement of Al Near the Phase Boundaries Between [actual symbol not reproducible]-Al and 7x7 Structures on Si(111) Surfaces / Katsuya Takaoka, Masamichi Yoshimura, Takafumi Yao, Tomoshige Sao, Tikashi Sueyoshi and Masashi Iwatsuki
Growth and Surface Morphology of Thin Silicon Films Using an Atomic Force Microscope / Rama I. Hegde, Mark A. Chonko and Philip J. Tobin. -- Solving Interface Structures by Combined Electron Microscopy and X-Ray Diffraction / A. Bourret and G. Feuillet. -- Quantitative HREM Study of the Atomic Structure of the [Sigma](310)/[001] Symmetric Tilt Grain Boundary in Nb / Wayne E. King and Geoffrey H. Campbell. -- HRTEM Observations of a [Sigma]=3 {112} Bicrystal Boundary in Aluminum / D.L. Medlin, M.J. Mills, W.M. Stobbs, M.S. Daw and F. Cosandey. -- Atomic Structure of the (310) Twin in Niobium: Theoretical Predictions and Comparison With Experimental Observation / Geoffrey H. Campbell, S.M. Foiles, M. Ruhle and W.E. King. -- Quantitative High-Resolution Electron Microscopy of Grain Boundaries in [alpha]-Al[subscript 2]O[subscript 3] / T. Hoche, P.R. Kenway, H.-J. Kleebe and M. Ruhle. -- Comparisons of Observed and Simulated Atomic Structures of Pd/NiO Heterophase Interfaces / M.I. Buckett, J.P. Shaffer and Karl L. Merkle. -- Atomic Structure of [Sigma]=5 (130) Symmetrical Tilt Boundary in Strontium Titanate / V. Ravikumar and Vinayak P. Dravid. -- Assessment of GaInAs/GaInAsP Interdiffusion Profiles Obtained Using STEM-EDX and HREM / R.E. Mallard, N.J. Long, G.R. Booker, E.J. Thrush and K. Scarrott. -- Electron Microscopy Characterization of Epitaxial Growth of Ag Deposited on MgO Microcubes / J. Liu, M. Pan and G.E. Spinnler. -- Real-time Viewing of Dynamic Processes on CdTe Surfaces at Elevated Temperature / David J. Smith, R. Vogl and Ping Lu
AFM Imaging of the Crystalline-to-Amorphous Transition on the Surface of Ion-Implanted Mica / Ray K. Eby, Grant S. Henderson, Fred J. Wicks and George W. Arnold. -- AFM Imagings of Ferritin Molecules Bound to LB Films of Poly-1-Benzyl-L-Histidine / Satomi Ohnishi, Masahiko Hara, Taiji Furuno, Wolfgang Knoll and Hiroyuki Sasabe. -- Artifacts in Atomic Force Microscopy of Nanoporous and Mesoporous Fiducial Samples / M.W. Deckman and R.J. Plano. -- Al Induced Reconstructions on the Si(111) Surfaces Studied by Scanning Tunneling Microscopy / Masamichi Yoshimura, Katsuya Takaoka, Takafumi Yao, Tomoshige Sato, Takashi Sueyoshi and Masashi Iwatsuki. -- Structure of the [Sigma]=3 (111) Grain Boundary in Cu-1.5%Sb / Richard W. Fonda and David E. Luzzi. -- High Resolution Electron Microscopy of [Sigma]=3 NiSi[subscript 2] [actual symbol not reproducible]Si and NiSi[subscript 2][actual symbol not reproducible]/(001)Si Interfaces / Wen-Jauh Chen and Fu-Rong Chen. -- Image Simulations of Ge Twin Boundaries / Stuart McKernan and C. Barry Carter. -- Surface Structure of Oxide Catalyst Microcrystals: High Resolution Electron Microscopy Study / G.N. Kryukova, A.L. Chuvilin and V.A. Sadykov. -- A Microstructural Study of Reaction-Bonded Silicon Carbide / K. Das Chowdhury, R.W. Carpenter and W. Braue. -- Compositional Analysis and High Resolution Imaging of Grain Boundaries in Pr-Doped ZnO Ceramics / I.G. Solorzano, J.B. VanDer Sande, K.K. Baek and H.L. Tuller
Atomic Structures and Defects of As-Grown Nb[subscript 1+[alpha]]S[subscript 2] Platelets on Nb Substrates / Chuxin Zhou and L.W. Hobbs. -- A Compact Nuclear Microprobe With a Liquid Metal Ion Source and a Toroidal Analyzer / Mikio Takai, Ryou Mimura, Hiroshi Sawaragi and Ryuso Aihara. -- In-Plane Asymmetries on the Ge(111)-c(2x8) Surface Mapped with the Scanning Tunneling Microscope / P. Molinas-Mata, J. Zegehhagen, M. Bohringer, N. Takeuchi and A. Selloni. -- Experimental Optimization for Imaging With Photoelectron Diffraction / J.G. Tobin, G.D. Waddill, Hua Li and S.Y. Tong. -- Low Energy Photoelectron Holography on GaAs / R. Denecke, R. Eckstein, L. Ley, A. Bocquet, J. Riley and R. Leckey. -- Effect of the Angular Momentum and Magnetic Quantum Numbers on Auger and Photoelectron Scattering / D.E. Ramaker, H. Yang and Y.U. Idzerda. -- Imaging of Metal/Semiconductor Interface by Ballistic-Electron-Emission Microscopy (BEEM) / E.Y. Lee, B.R. Turner, J.R. Jimenez and L.J. Schowalter. -- Low Energy Point Source Electron Microscopy / H.J. Kreuzer. -- Atomic Force Microscopic Imaging of Biologically Important Materials / Lorraine M. Siperko and William J. Landis. -- Characterization of Internal Interfaces by Atom Probe Field Ion Microscopy / M.K. Miller and Raman Jayaram. -- The Origins of High Spatial Resolution Secondary Electron Microscopy / M.R. Scheinfein, J.S. Drucker, J. Liu, J.K. Weiss, G.G. Hembree and J.M. Cowley. -- REM and Rheed Studies of Pb Adsorption on Si(111) / Yasumasa Tanishiro, Masahiko Fukuyama and Katsumichi Yagi
The Surface Structure of Oxides Studied With Reflected High Energy Electrons / Tung Hsu. -- Application of Z-Contrast Imaging to Obtain Column-By-Column Spectroscopic Analysis of Materials / Nigel D. Browning and Stephen J. Pennycook
Restricciones de acceso:
Use copy. Restrictions unspecified star. MiAaHDL
Detalles del sistema:
Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
Nota de acción:
digitized 2024. HathiTrust Digital Library committed to preserve pda MiAaHDL
Copyright/Depósito Legal:
623789196 638854253 638854265 1319192606
ISBN:
1558991905
9781558991903
Materia:
Autores:
Enlace a formato físico adicional:
Original (DLC) 93015224 (OCoLC)27812779
Punto acceso adicional serie-Título:
Materials Research Society symposia proceedings ; v. 295

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