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Atomic force microscopy/sca...
This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU. S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies
Monografía
monografia Rebiun38224545 https://catalogo.rebiun.org/rebiun/record/Rebiun38224545 m o d cr nn|008mamaa 130610s1997 nyua ob 101 0 eng d 868635112 934975448 1242889372 1243554389 1244626529 1245668918 9781475793253 electronic bk.) 1475793251 electronic bk.) 1475793278 9781475793277 9781475793277 10.1007/978-1-4757-9325-3 doi AU@ 000057648018 NZ1 15182627 NUI eng pn NUI GW5XE OCLCQ I9W UA@ COO OCLCF OCLCQ EBLCP OCL OCLCQ UAB OCLCQ OCLCO OCLCA LEAUB AU@ OCLCQ OCLCO OCLCQ OCLCO OCLCL OCLCQ OCLCL OCLCA TGMT bicssc TEC021000 bisacsh 502/.8/2 21 620.11 23 https://id.oclc.org/worldcat/ddc/E49V48jm9vcwFxQfDqd37DCb4p Atomic force microscopy/scanning tunneling microscopy 2 edited by Samuel H. Cohen and Marcia L. Lightbody Atomic force microscopy/scanning tunneling microscopy two New York Springer Science+Business Media 1997 New York New York Springer Science+Business Media 1 online resource (ix, 250 pages) illustrations 1 online resource (ix, 250 pages) Text txt rdacontent computer c rdamedia online resource cr rdacarrier "Proceedings of the Second U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7-9, 1994, in Natick, Massachusetts"--Title page verso Includes bibliographical references and index Scanned probe microscopy / Michael F. Crommie -- Scanning tunneling microscopy for Very Large-Scale Integration (VLSI) Inspection / Shane Y. Hong -- Scanning tunneling microscopy-based fabrication of nanometer scale structures / Munir H. Nayfeh -- A microscopy for our time / Elinor Solit -- Scanning tunneling microscopy of chemical vapor deposition diamond film growth on highly oriented pyrolytic graphite and silicon / A.F. Aviles [and others] --Scanning tunneling microscopy and atomic force microscopy of chemical-vapor-deposition diamond and diamond-like carbon thin films / T.W. Mercer [and others] This book represents the compilation of papers presented at the second Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium, held June 7 to 9, 1994, in Natick, Massachusetts, at Natick Research, Development and Engineering Center, now part ofU. S. Army Soldier Systems Command. As with the 1993 symposium, the 1994 symposium provided a forum where scientists with a common interest in AFM, STM, and other probe microscopies could interact with one another, exchange ideas and explore the possibilities for future collaborations and working relationships. In addition to the scheduled talks and poster sessions, there was an equipment exhibit featuring the newest state-of-the-art AFM/STM microscopes, other probe microscopes, imaging hardware and software, as well as the latest microscope-related and sample preparation accessories. These were all very favorably received by the meeting's attendees. Following opening remarks by Natick's Commander, Colonel Morris E. Price, Jr., and the Technical Director, Dr. Robert W. Lewis, the symposium began with the Keynote Address given by Dr. Michael F. Crommie from Boston University. The agenda was divided into four major sessions. The papers (and posters) presented at the symposium represented a broad spectrum of topics in atomic force microscopy, scanning tunneling microscopy, and other probe microscopies Atomic force microscopy- Congresses Scanning tunneling microscopy- Congresses Microscopie à force atomique- Congrès Microscopie à effet tunnel- Congrès Atomic force microscopy. Scanning tunneling microscopy. Kongress. Rasterkraftmikroskopie. Rastertunnelmikroskopie. Conference papers and proceedings. Natick (Mass., 1994) Cohen, Samuel H. Lightbody, Marcia L. U.S. Army Soldier Systems Command, Natick Research, Development, and Engineering Center Atomic Force Microscopy/Scanning Tunneling Microscopy (AFM/STM) Symposium 2nd :. 1994 :. Natick, Mass.) Printed edition 9781475793277